- built-in testing (BIT)
- Архитектура: встроенный контроль
Универсальный англо-русский словарь. Академик.ру. 2011.
built-in testing (BIT)
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Bit rot — Bit rot, also known as bit decay, data rot, or data decay, is a colloquial computing term used to describe either a gradual decay of storage media or the degradation of a software program over time. The latter use of the term implies that… … Wikipedia
Digital video testing — in broadcast video, for example, is the process of validating and verifying that the video content and other data is being correctly processed, stored and transported. Despite the fact that the data is digital, most digital tv (DTV) system… … Wikipedia
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GUI software testing — In computer science, GUI software testing is the process of testing a product that uses a graphical user interface, to ensure it meets its written specifications. This is normally done through the use of a variety of test cases.Testing GUI… … Wikipedia
64-bit — CPUs have existed in supercomputers since the 1960s and in RISC based workstations and servers since the early 1990s. In 2003 they were introduced to the (previously 32 bit) mainstream personal computer arena, in the form of the x86 64 and 64 bit … Wikipedia
40-bit encryption — refers to a key size of forty bits, or five bytes, for symmetric encryption; this represents a relatively low level of security. A forty bit length corresponds to a total of 2^{40} possible keys. Although this is a large number in human terms… … Wikipedia
встроенный контроль — — [А.С.Гольдберг. Англо русский энергетический словарь. 2006 г.] Тематики энергетика в целом EN built in testingBIT … Справочник технического переводчика
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Multi-site test — Multi site test, or multisite test , or concurrent test , or parallel test are all semiconductor Automatic Test Equipment (ATE) terms that generally refer to testing of multiple devices at the same time. Currently, devices refer to System on a… … Wikipedia
Commodore Datasette — Original shape … Wikipedia
